Characterization Tools

• Dektak 3030 profilometer
• Dektak 3 profilometer
  
  
• Nanoscience Easyscan 2 AFM
• Nanoscience Easyscan 2 STM
  
  
• Gaertner Ellipsometer I (manual with microspot)
• Gaertner Ellipsometer II (automated)
  
  
• Shimadzu UV-VIS-NIR spectrophotometer UV-3101
   

Please visit the CNL User pages for more details on these facilities (requires login)